atpg-ls/circuit.h

#pragma once

#include "option.h"

#include <string>
#include <vector>
#include <unordered_map>
#include <unordered_set>
#include <queue>


using ll = long long;

class Gate {
public:
    // 门的原始信息
    int id;
    int rtopo;
    std::string name;
    enum Type { AND, NAND, OR, NOR, XOR, XNOR, NOT, BUF, INPUT } type;
    int value;
    bool pi;
    bool po;
    std::vector<Gate*> fan_outs;
    std::vector<Gate*> fan_ins;

    std::vector<Gate*> pre_stems;
    std::vector<Gate*> suc_stems;

    // 记录全局已经发现的错误
    bool global_fault_detected[2];

    // atpg-ls 附加信息
    int CC;
    bool stem;
    bool propagate;

    int stem_weight;
    bool stem_satisfied;

    int fault_weight[2];
    bool fault_detected[2];

    int fault_propagate_length[2];

    // 计算此门的信息
    int recal_value();
    void recal_fault(bool fd[2]);
    void recal_propagate_len(int fpl[2]);

    // 门的某个输入产生的错误是否可以通过这个门传播
    bool is_detected(Gate* one_of_input);
};

class Circuit {
public:

// 电路的基本信息
std::vector<Gate*> PIs;
std::vector<Gate*> POs;
std::vector<Gate*> gates;
std::vector<Gate*> rtopo_gates;
std::vector<Gate*> stems; // PIs and POs are stems by default

std::unordered_map<std::string, Gate*> name2gate;

// 读入和输出电路
void parse_from_file(const char *filename);
void print_circuit();


// 初始化电路统计信息
int MAX_GATE_LEVEL;
void init_topo_index();

// 电路状态 checker
bool is_valid_circuit();

// local search

bool local_search();

int global_fault_undetected_count;

ll stem_total_cost;
int stem_total_cnt;

ll fault_propagate_score;

ll fault_total_weight;
int fault_total_cnt;

void ls_reset_data();
void ls_init_stems();
void ls_init_weight();

void ls_random_circuit();

void ls_statistics();

void ls_update_weight();

Gate* ls_pick();
Gate* ls_pick_falsified();

void ls_flip(Gate* stem);

ll ls_pick_score(Gate* stem);

ll ls_circuit_score();

int flip_cnt = 0;
double flip_time = 0;

int update_cnt = 0;
double update_time = 0;
};